Optical Characteristics of CdSSe Films Prepared by Thermal Evaporation Technique
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Structural & Optical Characterization of Gex Se80-x Pb20 Thin Films Prepared by Thermal Evaporation Technique
Vacuum evaporated films of GexSe80-xPb20 have been characterized by using optical spectroscopy (especially transmission and absorption spectra). The chalcogenide glass of GexSe80-xPb20 has been prepared by melt quenching technique. Thin films of GexSe80-xPb20 are deposited by vacuum thermal evaporation technique on highly clean glass substrates and their optical properties such as refractive in...
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WO3 and NiO-WO3 thin films of various thicknesses were deposited on an Al2O3-Si (alumina-silicon) substrate using high vacuum thermal evaporation. After annealing at 500C for 30 minutes in air, the crystallanity and surface morphology of WO3 and NiO-WO3 thin films were investigated using X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM). It is observed that the WO3 thin films were ...
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SiOx thin films with different stoichiometries from SiO1.3 to SiO1.8 have been prepared by evaporation of silicon monoxide in vacuum or under well-controlled partial pressures of oxygen sP,10−6 Torrd. These thin films have been characterized by x-ray photoemission and x-ray-absorption spectroscopies, this latter at the Si K and L2,3 absorption edges. It has been found that the films prepared in...
متن کاملEffect of Thickness on the Structural Properties of Tellurium Film Prepared by Thermal Evaporation
In this research, tellurium (Te) film with thicknesses of 100-250 nm were deposited on ceramic substrates by thermal evaporation at 373 K. The thickness of the film was determined by Rutherford backscattering spectroscopy. The influence of the thickness on the structural, morphological and molecular bonds was characterized using XRD, scanning electron microscope, and Raman spectroscopy. The XRD...
متن کاملOPTICAL AND ELECTRICAL PROPERTIES OF CdxZn8-xTe92CHALCOGENIDE THIN FILMS DEPOSITED BY THERMAL EVAPORATION AT LOW TEMPERATURE
CdxZn8-xTe92chalcogenideglass is prepared by melt quenching technique. The thin films of as-prepared glass are deposited by thermal evaporation technique under the vacuum better than 10torr. The optical parameters such as refractive index (n), extinction coefficient (k), the absorption coefficient (α), and optical band gap (Eg) are calculated from transmittance spectra in the 200-1800nm region....
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ژورنال
عنوان ژورنال: Baghdad Science Journal
سال: 2011
ISSN: 2411-7986,2078-8665
DOI: 10.21123/bsj.8.1.155-160